Defects in III-nitride microdisk cavities-Reference-Cited by-同舟云学术

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Defects in III-nitride microdisk cavities

Published:2017-02-14 Issue:3 Volume:32 Page:033002
ISSN:0268-1242
Container-title:Semiconductor Science and Technology
language:
Short-container-title:Semicond. Sci. Technol.

Author:

Ren C X,Puchtler T J,Zhu T,Griffiths J T,Oliver R A

Funder

European Research Council

Royal Academy of Engineering

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0268-1242/32/i=3/a=033002/pdf

Reference97 articles.

1. InGaN/GaN resonant-cavity LED including an AlInN/GaN Bragg mirror

2. CW lasing of current injection blue GaN-based vertical cavity surface emitting laser

3. Growth and assessment of InGaN quantum dots in a microcavity: A blue single photon source

4. Room-Temperature Polariton Lasing in Semiconductor Microcavities

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Heterogeneously integrated InGaN-based green microdisk light-emitters on Si (100);Optics Express;2022-07-08

2. Progress of GaN‐Based Optoelectronic Devices Integrated with Optical Resonances;Small;2022-02-26

3. Purcell-Effect-Enhanced Radiative Rate of Eu 3+ Ions in GaN Microdisks;Physical Review Applied;2020-12-18

4. III-nitride photonic cavities;Nanophotonics;2020-01-15

5. UV-C whispering-gallery modes in AlN microdisks with AlGaN-based multiple quantum wells on Si substrate;Journal of Nanophotonics;2018-05-08

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