Combined Scanning Nanoindentation and Tunneling Microscope Technique by Means of Semiconductive Diamond Berkovich Tip
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/61/i=1/a=148/pdf
Reference15 articles.
1. Non-contact AFM with a nanoindentation technique for measuring the mechanical properties of thin films
2. Surface Modification and Measurement Using a Scanning Tunneling Microscope With a Diamond Tip
3. Improvements in the indentation method with a surface force apparatus
4. Ion-Implanted Diamond Tip for a Scanning Tunneling Microscope
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3. Manufacturing and Characterization of Nanostructures Using Scanning Tunneling Microscopy with Diamond Tip;Journal of Nano Research;2016-07
4. Atomically resolved STM imaging with a diamond tip: simulation and experiment;Nanotechnology;2013-12-12
5. Boron-doped diamond single crystals for probes of the high-vacuum tunneling microscopy;Journal of Superhard Materials;2013-05
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