A calibration-free 10.7 fJ/conv.-step 12-bit 120-MS/s pipelined SAR ADC in 40nm CMOS

Abstract

Abstract A calibration-free 12-bit 120-MS/s 2-stage pipelined successive approximation register (pipelined SAR) analog-to-digital converter (ADC) is presented in this paper. In asynchronous SAR ADCs, capacitive digital-to-analog converters (CDACs) are designed with bottom-plate sampling to improve sampling accuracy and split-capacitor array to save switching energy. Furthermore, both reference scaling technique and a PVT-stabilized closed-loop residue amplifier are implemented in this design to obtain an accurate inter-stage gain, enabling no additional calibration required in the pipelined SAR ADC. The prototype ADC in 40nm CMOS technology achieves a peak signal-to-noise-distortion ratio (SNDR) of 73.4 dB and 88.91dB spurious-free-dynamic-range (SFDR) at 120 MS/s sampling rate, consuming 4.88 mW power from 0.9 V supply voltage, and corresponding to an excellent figure-of-merit (FoM) of 10.7 fJ/conv.-step.