A methodology for the extraction of quantitative information from electron microscopy images at the atomic level-Reference-Cited by-同舟云学术

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A methodology for the extraction of quantitative information from electron microscopy images at the atomic level

Published:2014-06-11 Issue: Volume:522 Page:012013
ISSN:1742-6588
Container-title:Journal of Physics: Conference Series
language:
Short-container-title:J. Phys.: Conf. Ser.

Author:

Galindo P L,Pizarro J,Guerrero E,Guerrero-Lebrero M P,Scavello G,Yáñez A,Núñez-Moraleda B M,Maestre J M,Sales D L,Herrera M,Molina S I

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

http://stacks.iop.org/1742-6596/522/i=1/a=012013/pdf

Reference19 articles.

1. Quantitative Atomic Resolution Scanning Transmission Electron Microscopy

2. High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment

3. Direct measurement of local lattice distortions in strained layer structures by HREM

4. Quantitative analysis of the deformation and chemical profiles of strained multilayers

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1. STEM Tools for Semiconductor Characterization: Beyond High-Resolution Imaging;Nanomaterials;2022-01-21

2. A new method to reliably determine elastic strain of various crystal structures from atomic-resolution images;Scientific Reports;2019-11-14

3. Influence of the crosstalk on the intensity of HAADF‐STEM images of quaternary semiconductor materials;Journal of Microscopy;2018-11-12

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