Effect of rapid thermal shock cycle on the thermomechanical reliability of 20Sn-80Pb solder bumps

Abstract

Abstract The influence of rapid thermal shock(RTS) cycles on 20Sn-80Pb solder bumps was studied. In the study, 20Sn-80Pb solder bumps were prepared by desktop nitrogen lead-free reflow soldering machine. The prepared 20Sn-80Pb solder bumps were used for RTS test in the temperature rang of 0°C ~ 150°C. One cycle of RTS is 24 seconds, and the temperature rise and fall rate of RTS is 12.5 C/s. The result indicated that when the cycle of RTS reached 1500T (here T is cycle, the same below), the shear strength of Sn-80Pb solder bump dropped by drastically 48.6%. Whereas, when the cycle of RTS reached 5500T, 20Sn-80Pb solder bumps’ shear strength decreased to 18.35 MPa, which increased by 7.5% compared with that of l6.97 MPa at 4500T. With the increase of RTS cycles, 20Sn-80Pb solder bumps’ shear strength was a decreasing trend and the fracture mechanism changed from ductile fracture to ductile-brittle mixed fracture, which could be subject to the thickening of the interfaical IMCs and the stress concentration caused by the growth of interfacial IMCs. To understand the changes of the mechanical properties of 20Sn-80Pb solder bumps, the influences of RTS on the crack and interfacial IMC of 20Sn-80Pb solder bumps were studied in details.