Analysis of structural properties of X-ray diffraction for composite copper-activated carbon by modified Williamson-Hall and size-strain plotting methods
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/1080/i=1/a=012007/pdf
Reference8 articles.
1. Modified Scherrer Equation to Estimate More Accurately Nano-Crystallite Size Using XRD
2. Size–strain study of NiO nanoparticles by X-ray powder diffraction line broadening
3. Williamson-Hall analysis in estimation of lattice strain in nanometer-sized ZnO particles
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