Weak-beam dark-field electron tomography of dislocations in GaN
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/26/i=1/a=059/pdf
Reference9 articles.
1. Electron tomography
2. The projection topograph: a new method in X-ray diffraction microradiography
3. Three-dimensional imaging of crystal defects by `topo-tomography'
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