Electron beam fabrication of masks in amorphous metalchalcogenide bilayers
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/26/i=1/a=050/pdf
Reference3 articles.
1. Electron beam induced chemical modification of amorphous chalcogenide–metal bilayers and its application
2. The dissolution of metals in amorphous chalcogenides and the effects of electron and ultraviolet radiation
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Review of metal-containing resists in electron beam lithography: perspectives for extreme ultraviolet patterning;Journal of Micro/Nanopatterning, Materials, and Metrology;2022-06-02
2. Effects of electron beam irradiation on a Ag/AsS2 bilayer using conductive atomic force microscopy;Thin Solid Films;2021-08
3. Growth of surface relief structures on Ag/AsS2 bilayer thin films by electron beam irradiation;Thin Solid Films;2017-08
4. The origin of electron beam patterning in silver/amorphous chalcogenide bilayers;Journal of Materials Science;2015-01-23
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3