Author:
Voegeli Wolfgang,Liang Xiaoyu,Shirasawa Tetsuroh,Arakawa Etsuo,Hyodo Kazuyuki,Kudo Hiroyuki,Yashiro Wataru
Abstract
Abstract
A multi-beam X-ray optics that can image a sample from different directions in a large angular range simultaneously without sample rotation is reported. It consists of 28 thin silicon crystals that are arranged in a σ-polarization diffraction geometry so that the diffracted X-rays from an incident white synchrotron radiation beam pass through the sample. A tomogram of a simple test sample was calculated from projection images recorded with the optics, showing that an alignment accuracy sufficient for X-ray tomography can be achieved.
Subject
General Physics and Astronomy
Cited by
1 articles.
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