Multi-beam X-ray optical system for high-speed tomography using a σ-polarization diffraction geometry

Abstract

Abstract A multi-beam X-ray optical system using a σ-polarization diffraction geometry is proposed and its potential for high-speed tomography using synchrotron radiation is experimentally evaluated. Projection images of a sample are obtained simultaneously from different directions with X-ray beams generated by diffraction of a white synchrotron radiation beam at silicon single crystals. This makes it possible to record a tomographic dataset without rotation of the sample or X-ray source. Data sets of two samples obtained in a proof-of-principle experiment with an exposure time of 1 ms were successfully reconstructed using an advanced compressed-sensing algorithm.