Scanning transmission X-ray microscopy of multi-walled carbon nanotubes-Reference-Cited by-同舟云学术

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Scanning transmission X-ray microscopy of multi-walled carbon nanotubes

Published:2009-09-01 Issue: Volume:186 Page:012106
ISSN:1742-6596
Container-title:Journal of Physics: Conference Series
language:
Short-container-title:J. Phys.: Conf. Ser.

Author:

Najafi Ebrahim,Cruz Daniel Hernández,Obst Martin,Hitchcock Adam P,Felten Alexandre,Douhard Bastien,Pireaux Jean-Jacques,Kaznatcheev Konstantine,Karunakaran Chithra

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

http://stacks.iop.org/1742-6596/186/i=1/a=012106/pdf

Reference10 articles.

1. Topological and SP3 defect structures in nanotubes

2. Resonant Electron Scattering by Defects in Single-Walled Carbon Nanotubes

3. Identifying and counting point defects in carbon nanotubes

4. Engineering of nanostructured carbon materials with electron or ion beams

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge;Beilstein Journal of Nanotechnology;2012-04-25

2. Measuring Point Defect Density in Individual Carbon Nanotubes Using Polarization-Dependent X-ray Microscopy;ACS Nano;2010-07-07

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