Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics-Reference-Cited by-同舟云学术

Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics

Published:2018-09-14 Issue:09 Volume:13 Page:P09011-P09011
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Evangelista Y.,Ambrosino F.,Feroci M.,Bellutti P.,Bertuccio G.,Borghi G.,Campana R.,Caselle M.,Cirrincione D.,Ficorella F.,Fiorini M.,Fuschino F.,Gandola M.,Grassi M.,Labanti C.,Malcovati P.,Mele F.,Morbidini A.,Picciotto A.,Rachevski A.,Rashevskaya I.,Sammartini M.,Zampa G.,Zampa N.,Zorzi N.,Vacchi A.

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

http://stacks.iop.org/1748-0221/13/i=09/a=P09011/pdf

Reference14 articles.

1. New detector concepts

2. Experimental confirmation of a new semiconductor detector principle

3. Novel pixel detectors for X-ray astronomy and other applications

4. The Wide Field Imager instrument for Athena

5. Development of the DEPFET Sensor With Signal Compression: A Large Format X-Ray Imager With Mega-Frame Readout Capability for the European XFEL

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