A pnCCD-based, fast direct single electron imaging camera for TEM and STEM-Reference-Cited by-同舟云学术

A pnCCD-based, fast direct single electron imaging camera for TEM and STEM

Published:2016-04-04 Issue:04 Volume:11 Page:P04006-P04006
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Ryll H.,Simson M.,Hartmann R.,Holl P.,Huth M.,Ihle S.,Kondo Y.,Kotula P.,Liebel A.,Müller-Caspary K.,Rosenauer A.,Sagawa R.,Schmidt J.,Soltau H.,Strüder L.

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

http://stacks.iop.org/1748-0221/11/i=04/a=P04006/pdf

Reference35 articles.

1. Direct single electron detection with a CMOS detector for electron microscopy

2. The European Photon Imaging Camera on XMM-Newton: The pn-CCD camera

3. Large-format, high-speed, X-ray pnCCDs combined with electron and ion imaging spectrometers in a multipurpose chamber for experiments at 4th generation light sources

4. A new pnCCD-based color X-ray camera for fast spatial and energy-resolved measurements

5. Applications of an energy‐dispersive pnCCD for X‐ray reflectivity: Investigation of interdiffusion in Fe–Pt multilayers

Cited by 106 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 4D STEM in SEM with a Fast Pixelated Direct Detector;Microscopy and Microanalysis;2024-07

2. An Advanced Smart Counting Mode for Pixelated Direct Electron Detectors Based on Semiconductors;Microscopy and Microanalysis;2024-07

3. 4D STEM and EELS Acquired Simultaneously with a Fast Pixelated Direct Detector with Center Hole;Microscopy and Microanalysis;2024-07

4. PNDetector – Global Supplier of Modern Radiation Detectors for High-Resolution Spectroscopy and High-Speed Imaging in Electron Microscopy;Microscopy and Microanalysis;2024-07

5. High‐speed 4‐dimensional scanning transmission electron microscopy using compressive sensing techniques;Journal of Microscopy;2024-05-06