Measurement of the electrical properties of a polycrystalline cadmium telluride for direct conversion flat panel x-ray detector
Author:
Publisher
IOP Publishing
Subject
Mathematical Physics,Instrumentation
Link
http://stacks.iop.org/1748-0221/9/i=01/a=P01010/pdf
Reference11 articles.
1. Direct-conversion flat-panel X-ray image sensors for digital radiography
2. Experimental evaluation of a novel CdZnTe flat-panel x-ray detector for digital radiography and fluoroscopy
3. X-ray sensitivity of photoconductors: application to stabilized a-Se
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