Tetraphenylene-based semiconductive metal–organic framework crystals for direct X-ray detection and imaging-Reference-Cited by-同舟云学术

Tetraphenylene-based semiconductive metal–organic framework crystals for direct X-ray detection and imaging

Published:2024 Issue:42 Volume:60 Page:5510-5513
ISSN:1359-7345
Container-title:Chemical Communications
language:en
Short-container-title:Chem. Commun.

Author:

Luo Qi¹²,Li Yuxia¹²,Huang Xin²,Zheng Yi²,Gu Qi³,Wang Shuaihua²⁴^ORCID,Wu Shaofan²⁴

Affiliation:

1. College of Chemistry and Materials Science, Fujian Normal University, Fuzhou, Fujian 350007, China

2. State Key Laboratory of Structural Chemistry, Fujian Institute of Research on Structure of Matter, Chinese Academy of Sciences, Fuzhou, Fujian 350002, China

3. College of Materials Science and Engineering, Sichuan University, Chengdu 610065, Sichuan, China

4. University of Chinese Academy of Science (UCAS), Beijing 100049, China

Abstract

In this work, we prepared Pb-TCPE, a three-dimensional MOF that can be used for direct X-ray detection. The sensitivity of the single crystal reaches 4812.6 μC Gyair−1 cm−2 under a bias voltage of 50 V. And the detection limit is 93.3 nGyair s−1.

Funder

National Key Research and Development Program of China

Natural Science Foundation of Fujian Province

Publisher

Royal Society of Chemistry (RSC)

Link

http://pubs.rsc.org/en/content/articlepdf/2024/CC/D4CC01188K

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