Preliminary characterisation of the HEXITECMHz spectroscopic X-ray imaging detector

Abstract

Abstract The HEXITECMHz ASIC is the next generation of the STFC's High Energy X-ray Imaging Technology (HEXITEC). With a ×100 increase in the camera frame rate to 1 MHz, the new ASIC is capable of delivering fully spectroscopic X-ray imaging at photon fluxes of 2×106 photons s-1 mm-2. The improved flux capability ensures the relevance of the technology at a new generation of difraction-limited storage ring (DLSR) synchrotrons as well as enabeling dynamic spectroscopic imaging with sub-keV energy resolution to be carried out on millisecond timescales. In this paper preliminary results from X-ray testing of a 0.3 mm thick p-type Si sensor and 2.0 mm thick HF-CdZnTe sensor at the Diamond Light Source Synchrotron are presented for the first time. Each module consists of 80 × 80 pixels on a 250 μm pixel pitch operated at a temperature of 20°C and a frame rate of 1 MHz. For these preliminary measurements, testing was completed using a prototype test system which limited readout to a portion of the 1 MHz output sampled over an SPI test interface at ∼50 Hz. Despite this limitation these measurements allow the spectroscopic performance of the ASIC to be characterised ahead of the full DAQ system. The prototype detectors were characterised using monochromatic X-rays with energies 12–35 keV at fluxes of (0.6 – 2.5) × 106 photons s-1 mm-2. At an X-ray energy of 12 keV, the energy resolution of the p-type Si and HF-CdZnTe detectors were measured to be 1.0 keV and 1.1 keV respectively. At the higher energies of 20 keV and 35 keV the energy resolution in the HF-CdZnTe was measured to be 1.2 keV and 1.4 keV respectively.