Electrical characterization of different DEPFET designs on die level-Reference-Cited by-同舟云学术

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Electrical characterization of different DEPFET designs on die level

Published:2014-01-13 Issue:01 Volume:9 Page:C01020-C01020
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Bergbauer B,Aschauer S,Bähr A,Hermenau K,Horstmann J,Lauf T,Lechner P,Majewski P,Meidinger N,Reiffers J,Richter R,Sandow C,Schaller G,Schopper F,Stefanescu A,Strüder L,Treis J

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

http://stacks.iop.org/1748-0221/9/i=01/a=C01020/pdf

Reference6 articles.

1. New detector concepts

2. DEPFET Macropixel Detectors for MIXS: Integration and Qualification of the Flight Detectors

3. The Wide Field Imager of the International X-ray Observatory

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electrical characterization of prototype DEPFET detectors for Athena's Wide Field Imager;UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXI;2019-09-09

2. Layout options of spectroscopic X-ray DEPFETs;Journal of Instrumentation;2019-08-07

3. Measurement results of different options for spectroscopic X-ray DEPFET sensors;Journal of Instrumentation;2018-09-17

4. Energy response of ATHENA WFI prototype detectors;Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray;2018-07-06

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