Layout options of spectroscopic X-ray DEPFETs-Reference-Cited by-同舟云学术

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Layout options of spectroscopic X-ray DEPFETs

Published:2019-08-07 Issue:08 Volume:14 Page:P08008-P08008
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Treberspurg W.,Andritschke R.,Bähr A.,Behrens A.,Hauser G.,Lechner P.,Meidinger N.,Müller-Seidlitz J.,Richter R.H.,Treis J.

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

https://iopscience.iop.org/article/10.1088/1748-0221/14/08/P08008/pdf

Reference13 articles.

1. The Wide Field Imager instrument for Athena

2. Measurement results of different options for spectroscopic X-ray DEPFET sensors

3. MIXS on BepiColombo and its DEPFET based focal plane instrumentation

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. DePFET—Recent Developments and Future Prospects;Frontiers in Physics;2022-06-03

2. Erratum: Layout options of spectroscopic X-ray DEPFETs;Journal of Instrumentation;2020-02-07

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