Development of low noise pixels and readout architectures for scientific applications in a 180 nm CMOS image sensor process

Abstract

Abstract Noise values of below 1e− for CMOS Image Sensors are now regularly reported for pixels with high conversion gain. This has allowed advances in many fields of imaging. However, there are also scientific applications where other properties such as radiation hardness are required alongside good noise performance. The layout changes required for this however, often lead to a reduction in conversion gain, making achieving the noise performance more challenging. In this paper, we present PRECISE, a test chip designed to apply the techniques of low noise imaging to pixels for other scientific applications, particularly those requiring radiation hardness. The design of the chip will be discussed, and first test results presented on some of the pixel types on the chip.