A Sub-0.5 Electron Read Noise VGA Image Sensor in a Standard CMOS Process-Reference-Cited by-同舟云学术

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A Sub-0.5 Electron Read Noise VGA Image Sensor in a Standard CMOS Process

Published:2016-09 Issue:9 Volume:51 Page:2180-2191
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Boukhayma Assim,Peizerat Arnaud,Enz Christian

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/4/7562573/07505917.pdf?arnumber=7505917

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