Surface damage characterization of FBK devices for High Luminosity LHC (HL-LHC) operations
Author:
Publisher
IOP Publishing
Subject
Mathematical Physics,Instrumentation
Link
http://stacks.iop.org/1748-0221/12/i=12/a=P12010/pdf
Reference17 articles.
1. Combined Bulk and Surface Radiation Damage Effects at Very High Fluences in Silicon Detectors: Measurements and TCAD Simulations
2. A combined surface and bulk TCAD damage model for the analysis of radiation detectors operating at HL-LHC fluences
3. Comprehensive modeling of bulk-damage effects in silicon radiation detectors
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