Thick-lens velocity-map imaging spectrometer with high resolution for high-energy charged particles-Reference-Cited by-同舟云学术

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Thick-lens velocity-map imaging spectrometer with high resolution for high-energy charged particles

Published:2014-05-30 Issue:05 Volume:9 Page:P05005-P05005
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Kling N G,Paul D,Gura A,Laurent G,De S,Li H,Wang Z,Ahn B,Kim C H,Kim T K,Litvinyuk I V,Cocke C L,Ben-Itzhak I,Kim D,Kling M F

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

http://stacks.iop.org/1748-0221/9/i=05/a=P05005/pdf

Reference38 articles.

1. Imaging ultrafast molecular dynamics with laser-induced electron diffraction

2. Time‐of‐Flight Mass Spectrometer with Improved Resolution

3. Time-of-flight electron spectrometer for a broad range of kinetic energies

4. Novel Time of Flight Instrument for Doppler Free Kinetic Energy Release Spectroscopy

5. Single-shot carrier–envelope phase measurement of few-cycle laser pulses

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