YxAl1−xN thin films-Reference-Cited by-同舟云学术

YxAl1−xN thin films

Published:2012-10-04 Issue:42 Volume:45 Page:422001
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Žukauskaitė Agnė,Tholander Christopher,Palisaitis Justinas,Persson Per O Å,Darakchieva Vanya,Sedrine Nebiha Ben,Tasnádi Ferenc,Alling Björn,Birch Jens,Hultman Lars

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference29 articles.

1. The ternary systems ScAlN and YAlN

2. Spontaneous polarization and piezoelectric constants of III-V nitrides

3. Enhancement of Piezoelectric Response in Scandium Aluminum Nitride Alloy Thin Films Prepared by Dual Reactive Cosputtering

4. Origin of the Anomalous Piezoelectric Response in WurtziteScxAl1−xNAlloys

5. Increased electromechanical coupling in w−ScxAl1−xN

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