The origins of the secondary electron signal in scanning electron microscopy

Author:

Robinson V N E

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Ratio of the mean secondary electron generation of backscattered electrons to primary electrons at high electron energy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-03

2. THE FORMULAS FOR THE SECONDARY ELECTRON YIELD AT HIGH INCIDENT ELECTRON ENERGY FROM GOLD AND ALUMINUM;Modern Physics Letters B;2009-07-30

3. The formula for the secondary electron yield at high incident electron energy from silver and copper;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-05

4. Scanning Electron Microscopy in Forensic Science;Encyclopedia of Analytical Chemistry;2006-09-15

5. Quantitative Imaging of Protein Adsorption on Patterned Organic Thin-Film Arrays Using Secondary Electron Emission;Journal of the American Chemical Society;2006-05-25

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