The evolution of texture in thin films and multilayers via synchrotron transmission Laue and grazing-incidence X-ray scattering
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/28/i=4A/a=058/pdf
Reference18 articles.
1. High Rate Thick Film Growth
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3. Relationship between texture and electromigration lifetime in sputtered AI-1% Si thin films
4. Perpendicular magnetic anisotropy in epitaxial ultrathin films of Fe and Co on Cu(100), Cu(110), and Cu(111)
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Advances in Structural and Morphological Characterization of Thin Magnetic Films: A Review;Materials;2023-11-24
2. Real Time Observation of Material Deformation Processes by Synchrotron White Beam X-ray Topography;MRS Proceedings;1997
3. The Role of Roughness in Texture Development;MRS Proceedings;1996
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