The angles of intersection between the surfaces corresponding to constant photometric parameters for a thin film on a substrate
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/10/i=18/a=019/pdf
Reference3 articles.
1. VI Methods for Determining Optical Parameters of Thin Films
2. A theoretical study of the sensitivities of some normal incidence methods for measuring the optical constants and thicknesses of thin films
3. The accuracy of some photometric methods for the determination of n, k and d for thin films
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Determination of thin‐film optical constants with an automatic reflectance and transmittance goniometer;Review of Scientific Instruments;1991-10
2. A survey of the accuracies of some methods for the determination of the optical constants of thin films;Optica Acta: International Journal of Optics;1985-02
3. The accuracy of photometric methods for determining the optical constants of thin absorbing films;Journal of Physics D: Applied Physics;1982-08-14
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