The accuracy of some photometric methods for the determination of n, k and d for thin films
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/3/i=4/a=304/pdf
Reference14 articles.
1. Méthode de calcul des constantes optiques des couches minces absorbantes à partir de mesures de réflexion et de transmission
2. Computational Method for Determining n and k for a Thin Film from the Measured Reflectance, Transmittance, and Film Thickness
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1. Methods for the determination of the optical constants of thin films from single transmission measurements: a critical review;Journal of Physics D: Applied Physics;2003-07-17
2. Error Limits in Dispersion Analysis;Optical Interference Coatings;1997
3. The accuracies of photometric, polarimetric and ellipsometric methods for the optical constants of thin films;Optics & Laser Technology;1985-10
4. Determination of optical constants of thin film coating materials based on inverse synthesis;Applied Optics;1983-10-15
5. A method for the determination of the complex refractive index of non-metallic thin films using photometric measurements at normal incidence;Thin Solid Films;1983-02
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