A quantitative analysis on the interfacial effect in the Pt/Ba0.5Sr0.5TiO3/La0.67Sr0.33MnO3heterostructure-Reference-Cited by-同舟云学术

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A quantitative analysis on the interfacial effect in the Pt/Ba0.5Sr0.5TiO3/La0.67Sr0.33MnO3heterostructure

Published:2006-06-02 Issue:12 Volume:39 Page:2565-2570
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Miao J,Wang Y,Tian H Y,Zhou X Y,Chan H L W,Choy C L,Cao L X,Zhao B R

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/39/i=12/a=014/pdf

Reference29 articles.

1. High-Permittivity Perovskite Thin Films for Dynamic Random-Access Memories

2. Microstructure and dielectric properties of Ba1−xSrxTiO3 films grown on LaAlO3 substrates

3. Electrical properties and microstructures of Pt/Ba0.5Sr0.5TiO3/SrRuO3 capacitors

4. Dielectric and electrical properties of sputter grown (Ba,Sr)TiO3 thin films

5. Microstructure dependence of electrical properties of (Ba0.5Sr0.5)TiO3thin films deposited on Pt/SiO2/Si

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