Topological characterization of antireflective and hydrophobic rough surfaces: are random process theory and fractal modeling applicable?
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/48/i=4/a=045301/pdf
Reference43 articles.
1. Mathematical Analysis of Random Noise
2. The statistical analysis of a random, moving surface
3. Random Process Model of Rough Surfaces
4. Discrete properties of random surfaces
5. Two-dimensional properties of random surfaces
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