X-Ray Diffraction Study of Plasma Exposed and Annealed AlSb Bilayer Thin Film
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics
Link
http://stacks.iop.org/1009-0630/15/i=4/a=13/pdf
Reference9 articles.
1. What Can Be Expected from High-Z Semiconductor Detectors?
2. AlSb single-crystal grown by HPBM
3. Study of annealing effects in Al-Sb bilayer thin films
4. Optical, electrical and thermoelectric power studies of Al-Sb thin film bilayer structure
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