New simple methods for jet cutting and for simultaneous thinning and cutting of disc specimens for electron microscopy
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/5/i=9/a=027/pdf
Reference6 articles.
1. Method of preparing Si and Ge specimens for examination by transmission electron microscopy
2. A technique for cutting disks from sheet gold
3. Automated Preparation of Electron‐Transparent Metal Foils
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Jet and Laser‐Jet Electrochemical Micromachining of Nickel and Steel;Journal of The Electrochemical Society;1989-08-01
2. Generation of Radiation Defects in the Vicinity of Twin Boundaries in EFG Silicon Ribbons;Springer Proceedings in Physics;1989
3. Observation of radiation defects generated in edge defined film fed growth silicon ribbons under 400 kV irradiation in the high‐resolution electron microscope;Journal of Applied Physics;1988-08
4. Pulsed‐jet etch chamber for preparing silicon samples for transmission electron microscopy;Review of Scientific Instruments;1985-04
5. Application of scanning transmission electron microscopy to semiconductor devices;Philosophical Magazine;1977-12
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