High resolution scanning electron microscopy with absorbed current at low intensity primary beams-Reference-Cited by-同舟云学术

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High resolution scanning electron microscopy with absorbed current at low intensity primary beams

Published:1985-01 Issue:1 Volume:18 Page:11-13
ISSN:0022-3735
Container-title:Journal of Physics E: Scientific Instruments
language:
Short-container-title:J. Phys. E: Sci. Instrum.

Author:

Maussion M

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation

Link

http://stacks.iop.org/0022-3735/18/i=1/a=002/pdf

Reference1 articles.

1. Detectors for the scanning electron microscope

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Controlling the deposition of Pt nanoparticles within the surface region of Nafion;Journal of Membrane Science;2011-07

2. Electron Detectors and Spectrometers;Springer Series in Optical Sciences;1998

3. Non-Contact Microprocessor Based Digital Laser Scanning Micrometer;IETE Journal of Research;1994-07

4. High-pressure scanning electron microscopy of insulating materials: A new approach;Journal of Microscopy;1991-11

5. Low‐loss electron images of uncoated photoresist in the scanning electron microscope;Applied Physics Letters;1986-09-29

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