1. Modern electrometer techniques;Barker;Proc. IEE.,1979
2. Charging effects in low voltage SEM metrology;Brunner;Scanning Electron Microsc. 1986,1986
3. Charge neutralisation using very low energy ions;Crawford;Scanning Electron Microsc. 1979,1979
4. Ion charge neutralisation effects in scanning electron microscopes;Crawford;Scanning Electron Microsc. 1980,1980
5. Mechanisms of detection and imaging in the ESEM;Danilatos;J. Microsc.,1990a