Measurement of the complex permittivity of thin films in the very low frequency range
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/12/i=3/a=019/pdf
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1. Dielectric properties in aged amorphous silicon oxide thin film;Journal of Alloys and Compounds;2008-05
2. Complex impedance study for Al/Dy2O3/Al thin film capacitors;Physica Status Solidi (a);1993-10-16
3. Dielectric and Optical Measurements for Some Compounds Exhibiting an Is-Ch-SmC* Phase Transition Sequence;Molecular Crystals and Liquid Crystals Incorporating Nonlinear Optics;1988-06
4. Low frequency dielectric relaxation study in PMMA/PS blends;Materials Chemistry and Physics;1987-12
5. Dielectric properties of ytterbium and dysprosium oxide films deposited by electron beam evaporation;Vacuum;1987-01
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