Inexpensive computer-controlled experimentation
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/12/i=5/a=018/pdf
Reference3 articles.
Cited by 19 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A fast high-accuracy lattice-parameter comparator;Journal of Applied Crystallography;1990-02-01
2. Sub-nanometre displacements calibration using X-ray interferometry;Measurement Science and Technology;1990-02-01
3. Raman spectroscopy using a DEC PDP 11/34 computer;Journal of Raman Spectroscopy;1988-12
4. Direct measurements of the complex X-ray atomic scattering factors for elements by X-ray interferometry at the Daresbury Synchrotron Radiation Source;Acta Crystallographica Section A Foundations of Crystallography;1986-11-01
5. Electronic charge distribution in silicon;Physical Review B;1985-03-15
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