Electronic charge distribution in silicon
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.31.3846/fulltext
Reference61 articles.
1. Effects of X-Ray Polarization on Pendellösung Fringes
2. Determination of structure factors of X-rays using half-widths of the Bragg diffraction curves from perfect single crystals
3. Absolute measurement of structure factors using a new dynamical interference effect
4. Anharmonicity and the Temperature Dependence of the Forbidden (222) Reflection in Silicon
5. Pendellösung Measurement of the (222) Reflection in Silicon
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