Barrier height control in metal/silicon contacts with atomically thin MoS 2 and WS 2 interfacial layers
Author:
Publisher
IOP Publishing
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science,General Chemistry
Link
https://iopscience.iop.org/article/10.1088/2053-1583/aad794/pdf
Reference27 articles.
1. Physics of Semiconductor Devices
2. Electron tunneling and contact resistance of metal-silicon contact barriers
3. Solid Solubilities of Impurity Elements in Germanium and Silicon*
4. Schottky Barrier Heights and the Continuum of Gap States
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