In situ laser reflectivity to monitor and control the nucleation and growth of atomically thin 2D materials*-Reference-Cited by-同舟云学术

In situ laser reflectivity to monitor and control the nucleation and growth of atomically thin 2D materials*

Published:2020-03-20 Issue:2 Volume:7 Page:025048
ISSN:2053-1583
Container-title:2D Materials
language:
Short-container-title:2D Mater.

Author:

Puretzky Alexander A^ORCID,Lin Yu-Chuan,Liu Chenze,Strasser Alex M,Yu Yiling,Canulescu Stela^ORCID,Rouleau Christopher M,Xiao Kai,Duscher Gerd,Geohegan David B

Publisher

IOP Publishing

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science,General Chemistry

Link

https://iopscience.iop.org/article/10.1088/2053-1583/ab7a72/pdf

Reference32 articles.

1. In situ ellipsometric study of optical properties of ultrathin films

2. In situspectroscopic ellipsometry study on the growth of ultrathin TiN films by plasma-assisted atomic layer deposition

3. In situspectroscopic ellipsometry as a versatile tool for studying atomic layer deposition

4. Synthesis of Novel Thin-Film Materials by Pulsed Laser Deposition

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