Slow expulsions and temperature measurements of highly charged ions from electron beam ion sources
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,Mathematical Physics,Atomic and Molecular Physics, and Optics
Link
http://stacks.iop.org/1402-4896/1997/i=T71/a=033/pdf
Reference39 articles.
1. Cryebis, an advanced multicharge ion source
2. Physics of the EBIS and Its Ions
3. The physics of electron beam ion sources
4. An electron beam ion source for the production of multiply charged heavy ions
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2. Self-cooling of highly charged ions during extraction from electron beam ion sources and traps;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-01
3. Developments on the KSU-CRYEBIS, a user facility for low energy, highly charged ions;Review of Scientific Instruments;1998-02
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