Author:
Stockli M. P.,Abdallah M.,Chen C. Y.,Cocke C. L.,De Paola B. D.,Fry D.,Gibson P. E.,Richard P.,Tipping T. N.,Walch B.,Winecki S.,Eastman B.,Gebel Th.,Langer E.,Lehnert U.,Preusse H.,Ullmann F.,Gorges A.,Ramassamy M.
Cited by
13 articles.
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1. DIAGNOSTICS FOR LASER ION SOURCES;Plasma Production by Laser Ablation;2004-10
2. Electron yield from Be–Cu induced by highly charged Xeq+ ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-11
3. Multiply charged ion-induced secondary electron emission from metals relevant for laser ion source beam diagnostics;Review of Scientific Instruments;2002-02
4. Electronic excitation effects on secondary ion emission in highly charged ion–solid interaction;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-08
5. Secondary-electron yield from Au induced by highly charged Ta ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-01