Interpretation of atomic force microscope (AFM) signals from surface charge on insulators
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/8/i=5/a=007/pdf
Reference27 articles.
1. The scanning dielectric microscope
2. Water vapour adsorption and surface conductivity in solids
3. Dielectric absorption currents and surface charge on polymeric insulators
4. Surface‐charge‐limited transient currents on insulating surfaces
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