Finite element analysis and equivalent parallel-resistance model for conductive multilayer thin films-Reference-Cited by-同舟云学术

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Finite element analysis and equivalent parallel-resistance model for conductive multilayer thin films

Published:2016-05-31 Issue:7 Volume:27 Page:074006
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Chen Yu-Yi,Juang Jia-Yang

Funder

National Taiwan University

Ministry of Science and Technology, Taiwan

Industrial Technology Research Institute

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Link

http://stacks.iop.org/0957-0233/27/i=7/a=074006/pdf

Reference29 articles.

1. Resistivity Measurements on Germanium for Transistors

2. Transparent Conducting Oxides for Photovoltaics

3. Transparent conductive Mg and Ga co-doped ZnO thin films for solar cells grown by magnetron sputtering: H2 induced changes

4. Aluminum-doped zinc oxide films as transparent conductive electrode for organic light-emitting devices

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