Capacitance measurement of Gaussian random rough surfaces with planar and corrugated electrodes
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference11 articles.
1. Scanning capacitance microscopy on a 25 nm scale
2. Near‐field scanning microwave microscope with 100 μm resolution
3. Theory of electrostatic probe microscopy: A simple perturbative approach
4. Perturbation theory for surface-profile imaging with a capacitive probe
5. Rough-surface capacitor: approximations of the capacitance with elementary functions
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