A novel method for the measurement of Young's modulus for thick-film resistor material by flexural testing of coated beams
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/9/i=12/a=015/pdf
Reference5 articles.
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4. Evaluation of the critical stress of anodized coating-AZ91D substrate using SEM in-situ technology;J ZHEJIANG UNIV-SC A;2016
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