Reference material for transmission electron microscope calibration-Reference-Cited by-同舟云学术

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Reference material for transmission electron microscope calibration

Published:2011-08-08 Issue:9 Volume:22 Page:094014
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Filippov M N,Gavrilenko V P,Kovalchuk M V,Mityukhlyaev V B,Ozerin Yu V,Rakov A V,Roddatis V V,Todua P A,Vasiliev A L

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Link

http://stacks.iop.org/0957-0233/22/i=9/a=094014/pdf

Reference15 articles.

1. Transmission Electron Microscopy

2. Determination of the Avogadro constant via the silicon route

3. Electron Microscopy-Based Measurement of Feature Thickness and Calibration of Reference Materials

4. TEM calibration methods for critical dimension standards

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