SPRITE: a modern approach to scanning probe contact resonance imaging
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/25/i=2/a=025405/pdf
Reference22 articles.
1. High-resolution characterization of piezoelectric ceramics by ultrasonic scanning force microscopy techniques
2. Atomic force acoustic microscopy methods to determine thin-film elastic properties
3. Viscoelastic Property Mapping with Contact Resonance Force Microscopy
4. Quantitative measurements of indentation moduli by atomic force acoustic microscopy using a dual reference method
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3. Atomic force microscopy for nanoscale mechanical property characterization;Journal of Vacuum Science & Technology B;2020-11
4. Error estimation and enhanced stiffness sensitivity in contact resonance force microscopy with a multiple arbitrary frequency lock-in amplifier (MAFLIA);Measurement Science and Technology;2020-09-09
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