Isomorphic contact resonance force microscopy and piezoresponse force microscopy of an AlN thin film: demonstration of a new contact resonance technique-Reference-Cited by-同舟云学术

Isomorphic contact resonance force microscopy and piezoresponse force microscopy of an AlN thin film: demonstration of a new contact resonance technique

Published:2020-06-16 Issue:2 Volume:4 Page:025003
ISSN:2399-1984
Container-title:Nano Futures
language:
Short-container-title:Nano Futures

Author:

Robins Lawrence H^ORCID,Brubaker Matt D^ORCID,Tung Ryan C^ORCID,Killgore Jason P^ORCID

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,General Materials Science,Biomedical Engineering,Atomic and Molecular Physics, and Optics,General Chemistry,Bioengineering

Link

https://iopscience.iop.org/article/10.1088/2399-1984/ab844f/pdf

Reference28 articles.

1. Applied Scanning Probe Methods XI

2. Applied Scanning Probe Methods II

3. Contact-resonance atomic force microscopy for viscoelasticity

4. Contact Resonance Force Microscopy for Viscoelastic Property Measurements: From Fundamentals to State-of-the-Art Applications

5. Contact-Resonance Piezoresponse Force Microscope and Its Application to Domain Observation of Pb(Mg1/3Nb2/3)O3–PbTiO3Single Crystals

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