Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Cited by
4 articles.
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1. A method for thickness determination of thin films of amalgamable metals by total-reflection X-ray fluorescence;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-08
2. Preface;Specular Gloss;2008
3. References;Specular Gloss;2008
4. Refractive Index - an encyclopedia article;RP Photonics Encyclopedia;2005