Carbon nanotube tips for scanning probe microscopy: fabrication and high aspect ratio nanometrology
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference29 articles.
1. Atomic Force Microscope
2. Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors
3. Carbon Nanotubes
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