Measurement and modelling of non-contact atomic force microscope cantilever properties from ultra-high vacuum to normal pressure conditions
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/22/i=5/a=055501/pdf
Reference27 articles.
1. Noncontact Atomic Force Microscopy
2. Quantification of antagonistic optomechanical forces in an interferometric detection system for dynamic force microscopy
3. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
4. Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy
5. Development of liquid-environment frequency modulation atomic force microscope with low noise deflection sensor for cantilevers of various dimensions
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